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Electrical measurement system for microwave devices (up to 43 GHz)
X-ray
Formula-HF3 digital tester
TESCAN MIRA LMU scanning electron microscope with AztecLive Advanced Ultim Max 65 detector for energy dispersive microanalysis
Plasma-chemical etching system for semiconductor structures dielectric layers
Installation for measurement of water vapor content in ICS package space
Active ECB testing sector
Passive ECB testing sector
Clean room. Probe station. Electrical measurement of uncased semiconductor items and ICS
OKOS VUE-250-P scanning acoustic microscope
Printed circuit boards
Automatic mounting
LF, HF and microwave hybrids
Metal and glass vacuum-tight parts
Mechanical processing
Assembly production
Testing facilties
Contract manufacturing services